Efficient Dc Go/no-go Test of an N-stage Pipelined Analog-to- Digital Converter
نویسندگان
چکیده
Nowadays, Analog to Digital Converters (ADCs) play an important role in many applications. Pipelined Analog-to-Digital Converters (PADCs) are extremely useful in high-speed applications. Testing PADC circuits became essential. In this paper, a low-cost test is developed for a one stage PADC. It is shown that only three DC test values are capable to detect all catastrophic faults in the stage by observing only the digital outputs of the stage under test and its succeeding stage. In addition, the test of an N-stage PADC is investigated in this paper using extra hardware to facilitate the test. Only eleven DC test inputs are capable to detect all faults in the N stages as well as the extra hardware circuitry. The test was verified using the Eldo simulator provided by Mentor Graphics Corp. on 90nm CMOS model provided by MOSIS.
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